Scanning Hall probe microscope

The scanning Hall probe microscope (SHPM) is a class of scanning probe microscope which incorporates the accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows a map of the magnetic induction associated with a sample to be created. Current state of the art SHPM systems utilise 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution (>300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K).

Additional recommended knowledge

References

A. M. Chang, H.D. Hallen, L. Harriot, H.F. Hess, H. L. Los, J. Kao, R.E. Miller and T.Y. Chang, Appl. Phys. Lett. 61, 1974 (1992).

v • d • e Scanning probe microscopy
Common microscopes	Atomic force microscope · Tapping AFM · Scanning tunneling microscope
Other microscopes	Electrostatic force microscope · Electrochemical scanning tunneling microscope · Kelvin probe force microscope · Magnetic force microscope · Magnetic resonance force microscopy · Near-field scanning optical microscope · Photothermal microspectroscopy · Scanning capacitance microscopy · Scanning gate microscopy · Scanning Hall probe microscope · Scanning ion-conductance microscopy · Spin polarized scanning tunneling microscopy · Scanning voltage microscopy
Applications	Scanning probe lithography · Dip-Pen Nanolithography · Feature-oriented scanning · IBM Millipede
See also	Nanotechnology · Microscope · Microscopy