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PEEMA PEEM (photoemission electron microscope) is one type of electron microscope, whereby electrons emitted from the surface of a sample by photoemission are used to image the surface. The emitted electrons are focused by electron lenses onto a screen, where a magnified image of the surface is visible. Additional recommended knowledgeThe PEEM was developed by E. Brüche in the early 1930s.
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This article is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "PEEM". A list of authors is available in Wikipedia. |