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PEEM



A PEEM (photoemission electron microscope) is one type of electron microscope, whereby electrons emitted from the surface of a sample by photoemission are used to image the surface. The emitted electrons are focused by electron lenses onto a screen, where a magnified image of the surface is visible.

The PEEM was developed by E. Brüche in the early 1930s.


 
This article is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "PEEM". A list of authors is available in Wikipedia.
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